Explore topic-wise InterviewSolutions in Electronics.

INFO: Full form for CPHA is Clock Phase in Electronics category
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INFO: Full form for ISFET is Ion Sensitive Field Effect Transistor in Electronics category
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INFO: Full form for CAFM is Computer Aided Facilities Management in Electronics category
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INFO: Full form for STEP is Standard for Exchange of Product Model Data (iso 10303) in Electronics category
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INFO: Full form for SEL is Surface-emitting Laser in Electronics category
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INFO: Full form for ASDL is American Standard Digital Line in Electronics category
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INFO: Full form for SMIF is Standard Mechanical Interface in Electronics category
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INFO: Full form for ECIA is Electronic Components Industry Association in Electronics category
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INFO: Full form for ASES is Audio Sound Erase Static in Electronics category
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INFO: Full form for PALC is Plasma Addressed Liquid Crystal in Electronics category
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A small outline integrated circuit (SOIC) is a surface-mounted integrated circuit (IC) package which occupies an area about 30–50% less than an equivalent dual in-line package (DIP), with a typical thickness being 70% less. They are generally available in the same pin-outs as their counterpart DIP ICs. The convention for naming the package is SOIC or SO followed by the number of pins. For example, a 14-pin 4011 would be housed in an SOIC-14 or SO-14 package.

INFO: Full form for PSL is Polystyrene Latex in Electronics category
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INFO: Full form for PSL is Porous Silicon Layer in Electronics category
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INFO: Full form for SSPD is Solid State Power Divider in Electronics category
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INFO: Full form for MSDP is Multi-channel Subtractive Double Pass in Electronics category
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INFO: Full form for SOLAR is Solar Activated Rectifier in Electronics category
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INFO: Full form for ICON is International Council On Nanotechnology in Electronics category
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Source Code Control System (SCCS) is a version control system designed to track changes in source code and other text files during the development of a piece of software. This allows the user to retrieve any of the previous versions of the original source code and the changes which are stored. It was originally developed at Bell Labs beginning in late 1972 by Marc Rochkind for an IBM System/370 computer running OS/360.

A characteristic feature of SCCS is the sccsid string that is embedded into source code, and automatically updated by SCCS for each revision. This example illustrates its use in the C programming language:

This string contains the file name, date, and can also contain a comment. After compilation, the string can be found in binary and object files by looking for the pattern "@(#)" and can be used to determine which source code files were used during compilation. The "what" command [1] is available to automate this search for version strings.

INFO: Full form for SSPB is Solid State Power Booster in Electronics category
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INFO: Full form for SAED is Selected Area Electron Diffraction in Electronics category
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INFO: Full form for ACRF is Attenuation Crosstalk Ratio At Farend in Electronics category
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INFO: Full form for STOL is Short Time Overload in Electronics category
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INFO: Full form for SMED is Single Minute Exchange of Dies in Electronics category
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INFO: Full form for BLUE is Baltic Latvian Universal Electronics in Electronics category
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The Asteroid Terrestrial-impact Last Alert System (ATLAS; Observatory codes T05 and T08) is a robotic astronomical survey and early warning system optimized for detecting smaller near-Earth objects a few weeks to days before they impact Earth.

Funded by NASA, and developed and operated by the University of Hawaii's Institute for Astronomy, the system currently has two 0.5-meter telescopes located 160 km apart, at Haleakala (ATLAS-HKO) and Mauna Loa (ATLAS-MLO) observatories.

ATLAS began observations in 2015 with one telescope and its two-telescopes version has been operational since 2017. Each of the two telescopes surveys one quarter of the whole observable sky four times per clear night, for a four-fold coverage of the observable sky every two clear nights.

The project has obtained NASA funding for two additional telescopes in the Southern hemisphere. Once operational, those two telescopes will improve ATLAS's four-fold coverage of the observable sky from every two clear nights to nightly, and will fill its current blind spot in the far southern sky.

Abbreviated Test Language for All Systems (ATLAS) is a MILSPEC language for automatic testing of avionics equipment. It is a high-level computer language and can be used on any computer whose supporting software can translate it into the appropriate low-level instructions.

INFO: Full form for ACRP is Automatic Contact Resistance Probe in Electronics category
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INFO: Full form for AMHS is Automated Material Handling System in Electronics category
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INFO: Full form for ADFE is Adaptive Decision Feedback Equalization in Electronics category
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INFO: Full form for USG is Undoped Silicate Glass in Electronics category
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A semiconductor material has an electrical conductivity value falling between that of a conductor, such as metallic copper, and an insulator, such as glass. Its resistivity falls as its temperature rises; metals behave in the opposite way. Its conducting properties may be altered in useful ways by introducing impurities ("doping") into the crystal structure. When two differently doped regions exist in the same crystal, a semiconductor junction is created. The behavior of charge carriers, which include electrons, ions and electron holes, at these junctions is the basis of diodes, transistors and most modern electronics. Some examples of semiconductors are silicon, germanium, gallium arsenide, and elements near the so-called "metalloid staircase" on the periodic table. After silicon, gallium arsenide is the second-most common semiconductor and is used in laser diodes, solar cells, microwave-frequency integrated circuits, and others. Silicon is a critical element for fabricating most electronic circuits.

Semiconductor devices can display a range of useful properties, such as passing current more easily in one direction than the other, showing variable resistance, and having sensitivity to light or heat. Because the electrical properties of a semiconductor material can be modified by doping and by the application of electrical fields or light, devices made from semiconductors can be used for amplification, switching, and energy conversion.

The conductivity of silicon is increased by adding a small amount (of the order of 1 in 108) of pentavalent (antimony, phosphorus, or arsenic) or trivalent (boron, gallium, indium) atoms. This process is known as doping, and the resulting semiconductors are known as doped or extrinsic semiconductors. Apart from doping, the conductivity of a semiconductor can be improved by increasing its temperature. This is contrary to the behavior of a metal, in which conductivity decreases with an increase in temperature.

The modern understanding of the properties of a semiconductor relies on quantum physics to explain the movement of charge carriers in a crystal lattice. Doping greatly increases the number of charge carriers within the crystal. When a doped semiconductor contains free holes, it is called "p-type", and when it contains free electrons, it is known as "n-type". The semiconductor materials used in electronic devices are doped under precise conditions to control the concentration and regions of p- and n-type dopants. A single semiconductor device crystal can have many p- and n-type regions; the p–n junctions between these regions are responsible for the useful electronic behavior. Using a hot-point probe, one can determine quickly whether a semiconductor sample is p- or n-type.

Some of the properties of semiconductor materials were observed throughout the mid 19th and first decades of the 20th century. The first practical application of semiconductors in electronics was the 1904 development of the cat's-whisker detector, a primitive semiconductor diode used in early radio receivers. Developments in quantum physics led in turn to the invention of the transistor in 1947, the integrated circuit in 1958, and the MOSFET (metal–oxide–semiconductor field-effect transistor) in 1959.

INFO: Full form for ISPM is In-situ Particle Monitor in Electronics category
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INFO: Full form for PAPR is Peak-to-average Power Ratio in Electronics category
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INFO: Full form for ABH is Android Brotherhood in Electronics category
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INFO: Full form for WAMA is Wafer Mapping in Electronics category
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INFO: Full form for SSPT is Single Switch Performance Test in Electronics category
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INFO: Full form for SSPS is Super Symmetric Power Supply in Electronics category
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INFO: Full form for CRES is Corrosion Resistant Engineered Solutions in Electronics category
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INFO: Full form for USJ is Ultra-shallow Junction in Electronics category
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INFO: Full form for VCM is Vertical Current Meter in Electronics category
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INFO: Full form for RAMP is Reliability Analysis and Modeling Program in Electronics category
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INFO: Full form for PME is Paramagnetic Meissner Effect in Electronics category
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